ANALYTICAL STUDY OF PLATINUM SILICIDE FORMATION

被引:58
作者
BINDELL, JB
COLBY, JW
WONSIDLER, DR
POATE, JM
CONLEY, DK
TISONE, TC
机构
[1] BELL TEL LABS INC,ALLENTOWN,PA 18103
[2] BELL TEL LABS INC,MURRAY HILL,NJ 07974
[3] WESTERN ELECT CO INC,ALLENTOWN,PA 18103
[4] GOULD INC,ROLLING MEADOWS,IL 60008
关键词
D O I
10.1016/0040-6090(76)90612-X
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:441 / 452
页数:12
相关论文
共 14 条
[1]  
ANDERSEN CA, 1969, INT J MASS SPECTROM, V2, P61
[2]  
BROWN WC, UNPUBLISHED DATA
[3]  
CHANG CC, 1974, CHARACTERIZATION SOL
[4]   COMPARISON OF BACKSCATTERING SPECTROMETRY AND SECONDARY ION MASS-SPECTROMETRY BY ANALYSIS OF TANTALUM PENTOXIDE LAYERS [J].
CHU, WK ;
NICOLET, MA ;
MAYER, JW ;
EVANS, CA .
ANALYTICAL CHEMISTRY, 1974, 46 (14) :2136-2141
[5]   PRINCIPLES AND APPLICATIONS OF ION-BEAM TECHNIQUES FOR ANALYSIS OF SOLIDS AND THIN-FILMS [J].
CHU, WK ;
MAYER, JW ;
NICOLET, MA ;
BUCK, TM ;
AMSEL, G ;
EISEN, F .
THIN SOLID FILMS, 1973, 17 (01) :1-41
[6]  
CHU WK, 1974, ION BEAM SURFACE LAY, P423
[7]  
COLBY JW, 1971, 6TH P NAT C EL PROB
[8]   PLATINUM SILICIDE FORMATION - ELECTRON-SPECTROSCOPY OF PLATINUM-PLATINUM SILICIDE INTERFACE [J].
DANYLUK, S ;
MCGUIRE, GE .
JOURNAL OF APPLIED PHYSICS, 1974, 45 (12) :5141-5144
[9]   INTERACTION OF AL LAYERS WITH POLYCRYSTALLINE SI [J].
NAKAMURA, K ;
NICOLET, MA ;
MAYER, JW ;
BLATTNER, RJ ;
EVANS, CA .
JOURNAL OF APPLIED PHYSICS, 1975, 46 (11) :4678-4684
[10]   KINETICS AND MECHANISM OF PLATINUM SILICIDE FORMATION ON SILICON [J].
POATE, JM ;
TISONE, TC .
APPLIED PHYSICS LETTERS, 1974, 24 (08) :391-393