LOW-TEMPERATURE ATOMIC FORCE MICROSCOPY

被引：56

作者：

KIRK, MD

ALBRECHT, TR

QUATE, CF

机构：

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1988年 / 59卷 / 06期

关键词：

D O I：

10.1063/1.1139788

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：833 / 835

页数：3

共 16 条

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[4]

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[5]

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SLOUGH, G .

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[7]

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[8] ATOMIC FORCE MICROSCOPY OF LIQUID-COVERED SURFACES - ATOMIC RESOLUTION IMAGES [J].

MARTI, O ;

DRAKE, B ;

HANSMA, PK .

APPLIED PHYSICS LETTERS, 1987, 51 (07) :484-486

[9] ATOMIC FORCE MICROSCOPY OF AN ORGANIC MONOLAYER [J].

MARTI, O ;

RIBI, HO ;

DRAKE, B ;

ALBRECHT, TR ;

QUATE, CF ;

HANSMA, PK .

SCIENCE, 1988, 239 (4835) :50-52

[10] ATOMIC-SCALE FRICTION OF A TUNGSTEN TIP ON A GRAPHITE SURFACE [J].

MATE, CM ;

MCCLELLAND, GM ;

ERLANDSSON, R ;

CHIANG, S .

PHYSICAL REVIEW LETTERS, 1987, 59 (17) :1942-1945

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