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IMAGING OF CRYSTALLINE SUBSTANCES IN SCANNING-TRANSMISSION ELECTRON-MICROSCOPY
被引:8
作者
:
YAMAMOTO, T
论文数:
0
引用数:
0
h-index:
0
机构:
JEOL LTD,NAKAGAMI,AKISHIMA,TOKYO,JAPAN
JEOL LTD,NAKAGAMI,AKISHIMA,TOKYO,JAPAN
YAMAMOTO, T
[
1
]
NISHIZAWA, H
论文数:
0
引用数:
0
h-index:
0
机构:
JEOL LTD,NAKAGAMI,AKISHIMA,TOKYO,JAPAN
JEOL LTD,NAKAGAMI,AKISHIMA,TOKYO,JAPAN
NISHIZAWA, H
[
1
]
机构
:
[1]
JEOL LTD,NAKAGAMI,AKISHIMA,TOKYO,JAPAN
来源
:
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH
|
1975年
/ 28卷
/ 01期
关键词
:
D O I
:
10.1002/pssa.2210280127
中图分类号
:
T [工业技术];
学科分类号
:
08 ;
摘要
:
引用
收藏
页码:237 / 248
页数:12
相关论文
共 13 条
[11]
RECIPROCITY IN ELECTRON DIFFRACTION AND MICROSCOPY
[J].
POGANY, AP
论文数:
0
引用数:
0
h-index:
0
POGANY, AP
;
TURNER, PS
论文数:
0
引用数:
0
h-index:
0
TURNER, PS
.
ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY,
1968,
A 24
:103
-&
[12]
REIMER L, 1973, 6 EUR C EL MICR NEWC, P120
[13]
ON THE TEMPERATURE DIFFUSE SCATTERING OF ELECTRONS .1. DERIVATION OF GENERAL FORMULAE
[J].
TAKAGI, S
论文数:
0
引用数:
0
h-index:
0
TAKAGI, S
.
JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN,
1958,
13
(03)
:278
-286
←
1
2
→
共 13 条
[11]
RECIPROCITY IN ELECTRON DIFFRACTION AND MICROSCOPY
[J].
POGANY, AP
论文数:
0
引用数:
0
h-index:
0
POGANY, AP
;
TURNER, PS
论文数:
0
引用数:
0
h-index:
0
TURNER, PS
.
ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY,
1968,
A 24
:103
-&
[12]
REIMER L, 1973, 6 EUR C EL MICR NEWC, P120
[13]
ON THE TEMPERATURE DIFFUSE SCATTERING OF ELECTRONS .1. DERIVATION OF GENERAL FORMULAE
[J].
TAKAGI, S
论文数:
0
引用数:
0
h-index:
0
TAKAGI, S
.
JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN,
1958,
13
(03)
:278
-286
←
1
2
→