A SMALL GEOMETRY MOSFET MODEL FOR CAD APPLICATIONS

被引:21
作者
GUEBELS, PP [1 ]
VANDEWIELE, F [1 ]
机构
[1] CATHOLIC UNIV LOUVAIN,B-1348 LOUVAIN LA NEUVE,BELGIUM
关键词
D O I
10.1016/0038-1101(83)90121-1
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:267 / 273
页数:7
相关论文
共 21 条
[1]   AN ANALYTICAL EXPRESSION FOR THE THRESHOLD VOLTAGE OF A SMALL GEOMETRY MOSFET [J].
AKERS, LA .
SOLID-STATE ELECTRONICS, 1981, 24 (07) :621-627
[2]   MEASUREMENT OF INTERFACE STATE CHARACTERISTICS OF MOS-TRANSISTOR UTILIZING CHARGE-PUMPING TECHNIQUES [J].
BACKENSTO, WV ;
VISWANATHAN, CR .
IEE PROCEEDINGS-I COMMUNICATIONS SPEECH AND VISION, 1981, 128 (02) :44-52
[3]   CHARGE-SHEET MODEL OF MOSFET [J].
BREWS, JR .
SOLID-STATE ELECTRONICS, 1978, 21 (02) :345-355
[4]  
ELMANSY YA, 1975, IEDM, P31
[5]  
Guebels P. P., 1981, International Electron Devices Meeting, P211
[6]   REVIEW OF SOME CHARGE TRANSPORT PROPERTIES OF SILICON [J].
JACOBONI, C ;
CANALI, C ;
OTTAVIANI, G ;
QUARANTA, AA .
SOLID-STATE ELECTRONICS, 1977, 20 (02) :77-89
[7]   MODELING OF SCALED-DOWN MOS-TRANSISTORS [J].
KLAASSEN, FM ;
DEGROOT, WCJ .
SOLID-STATE ELECTRONICS, 1980, 23 (03) :237-242
[8]  
Ko P. K., 1981, International Electron Devices Meeting, P600
[9]   MICROPROCESSOR-CONTROLLED ACQUISITION-SYSTEM FOR THE DETERMINATION OF MOS-TRANSISTOR PARAMETERS [J].
LAMBOT, JP ;
FONTAINE, A ;
JESPERS, PGA ;
WHITE, MH .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1981, 30 (02) :124-128
[10]   A SIMPLE-MODEL OF THE THRESHOLD VOLTAGE OF SHORT AND NARROW CHANNEL MOSFETS [J].
MERCKEL, G .
SOLID-STATE ELECTRONICS, 1980, 23 (12) :1207-1213