PROPOSAL FOR SURFACE TUNNEL TRANSISTORS

被引:78
作者
BABA, T
机构
[1] Fundamental Research Laboratories, NEC Corporation, Tsukuba, Ibaraki, 305
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1992年 / 31卷 / 4B期
关键词
TUNNEL TRANSISTOR; INTERBAND TUNNELING; DEGENERATED SEMICONDUCTOR; GAAS/ALGAAS; MBE; REGROWTH;
D O I
10.1143/JJAP.31.L455
中图分类号
O59 [应用物理学];
学科分类号
摘要
A new three-terminal tunnel device, the surface tunnel transistor (STT), is proposed and its operation is demonstrated using GaAs/AlGaAs. STT consists of n+/i/p+ diode structure with an insulated gate in the i-region, which is similar to a MOSFET. However, the source and drain are oppositely doped. The most important feature of this device is that the drain must be so highly degenerated that a tunnel junction is formed with a two-dimensional (2D) electron channel under the gate. The tunneling current from source to drain is controlled by the gate bias through the concentration of accumulated 2D electrons under the gate. GaAs STTs with i-Al0.6Ga0.4As as a gate insulator are fabricated using MBE regrowth techniques on a mesa structure. This device exhibits transistor characteristics at 77 K and at room temperature, which confirms the new operation principle of STTs.
引用
收藏
页码:L455 / L457
页数:3
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