QUANTITATIVE-ANALYSIS OF WEAK LOCALIZATION IN THIN MG FILMS BY MAGNETORESISTANCE MEASUREMENTS

被引：70

作者：

BERGMANN, G

机构：

来源：

PHYSICAL REVIEW B | 1982年 / 25卷 / 04期

关键词：

D O I：

10.1103/PhysRevB.25.2937

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：2937 / 2939

页数：3

共 23 条

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[7]

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