CONTACT RESISTANCE CHARACTERISTICS OF RHODIUM CONTACTS

被引：0
|
作者：
HAYASHI, Y
HARA, T
KUBO, M
机构：
[1] FUJITSU LTD,DEPT COMPONENTS DEV,KAWASAKI 211,JAPAN
[2] FUJITSU LTD,DEPT COMPONENTS MKT,TOKYO 105,JAPAN
来源：
ELECTRONICS & COMMUNICATIONS IN JAPAN | 1975年 / 58卷 / 12期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：117 / 125
页数：9
相关论文
共 50 条
  • [41] Minimization of the contact resistance between InAs nanowires and metallic contacts
    Sourribes, M. J. L.
    Isakov, I.
    Panfilova, M.
    Warburton, P. A.
    NANOTECHNOLOGY, 2013, 24 (04)
  • [42] Gold plated contacts: Effect of thermal aging on contact resistance
    Antler, M
    ELECTRICAL CONTACTS - 1997: PROCEEDINGS OF THE FORTY-THIRD IEEE HOLM CONFERENCE ON ELECTRICAL CONTACTS, 1997, : 121 - 131
  • [43] Chaotic predication of dynamic contact resistance times series on contacts
    Li, Lingling
    Ma, Dongjuan
    Li, Zhigang
    Diangong Jishu Xuebao/Transactions of China Electrotechnical Society, 2014, 29 (09): : 187 - 193
  • [44] Specific contact resistance measurements of ohmic contacts to semiconducting diamond
    1600, American Inst of Physics, Woodbury, NY, USA (77):
  • [45] High contact resistance readings on clean microwave mobile contacts
    Kwiatkowski, R
    Vladimirescu, M
    Zybura, A
    Bradic, J
    ELECTRICAL CONTACTS-2004: PROCEEDINGS OF THE 50TH IEEE HOLM CONFERENCE ON ELECTRICAL CONTACTS/THE 22ND INTERNATIONAL CONFERENCE ON ELECTRICAL CONTACTS, 2004, : 160 - 167
  • [46] Low specific contact resistance Ti/Au contacts on ZnO
    Chen, JJ
    Jang, S
    Anderson, TJ
    Ren, F
    Li, Y
    Kim, HS
    Gila, BP
    Norton, DP
    Pearton, SJ
    APPLIED PHYSICS LETTERS, 2006, 88 (12)
  • [47] Regression Model for the Specific Contact Resistance of SiC Ohmic Contacts
    Nicholls, Jordan R.
    Dimitrijev, Sima
    IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, 2021, 34 (04) : 493 - 499
  • [48] Calculation of BGA Contact Resistance by Using the Contacts Volume Method
    Wrona, Rafal
    Drozd, Zdzislaw
    2008 31ST INTERNATIONAL SPRING SEMINAR ON ELECTRONICS TECHNOLOGY: RELIABILITY AND LIFE-TIME PREDICTION, 2008, : 37 - +
  • [49] NEW METHOD OF ANALYZING CONTACT RESISTANCE OF VARIOUS SHAPED CONTACTS
    CHANG, CY
    FANG, YK
    SU, YK
    LIU, BD
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1979, 126 (08) : C332 - C332
  • [50] INTERMETALLIC GROWTH AND CONTACT RESISTANCE OF TIN CONTACTS AFTER AGING
    LINDBORG, U
    ASTHNER, B
    LIND, L
    REVAY, LB
    IEEE TRANSACTIONS ON PARTS HYBRIDS AND PACKAGING, 1976, 12 (01): : 33 - 39
12345