STUDY OF LOW-FREQUENCY RELAXATION PHENOMENA IN THIN-FILM CAPACITORS

被引：0

作者：

DEWILDE, W ^{[1
]}

DEMEY, G ^{[1
]}

机构：

[1] GHENT STATE UNIV, ELECTR LAB, GHENT, BELGIUM

来源：

APPLIED SCIENTIFIC RESEARCH | 1976年 / 31卷 / 06期

关键词：

D O I：

暂无

中图分类号：

O414.1 [热力学];

学科分类号：

摘要：

引用

页码：401 / 430

页数：30

共 48 条

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ARGALL, F
JONSCHER, AK
[J]. THIN SOLID FILMS, 1968, 2 (03) : 185 - &
[5] BURVENICH X, 1971, GALVANO, V415, P851
[6] BURVENICH X, 1971, GALVANO, V414, P749
[7] SCHOTTKY EFFECT FOR CLEAN SILICON SURFACES
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WULLSCHLEGER, J
[J]. PHYSIK DER KONDENSITERTEN MATERIE, 1970, 12 (01): : 47 - +
[8] POLARIZATION IN ELECTROLYTIC SOLUTIONS .1. THEORY
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JAFFE, G
[J]. JOURNAL OF CHEMICAL PHYSICS, 1952, 20 (07) : 1071 - 1077
[9] Chopra KL, 1969, THIN FILM PHENOMENA, P91
[10] Dispersion and absorption in dielectrics I. Alternating current characteristics
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[J]. JOURNAL OF CHEMICAL PHYSICS, 1941, 9 (04) : 341 - 351