STUDIES ON GROWTH DEFECTS IN SYNTHETIC QUARTZ BY X-RAY TOPOGRAPHY

被引：27

作者：

YOSHIMURA, J ^{[1
]}

KOHRA, K ^{[1
]}

机构：

[1] UNIV TOKYO,FAC ENGN,DEPT APPL PHYS,BUNKYO KU,TOKYO,JAPAN

来源：

JOURNAL OF CRYSTAL GROWTH | 1976年 / 33卷 / 02期

关键词：

D O I：

10.1016/0022-0248(76)90058-0

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

页码：311 / 323

页数：13

共 50 条

[1] X-RAY TOPOGRAPHY AND EPMA STUDIES OF SYNTHETIC QUARTZ
HOMMA, S
IWATA, M
JOURNAL OF CRYSTAL GROWTH, 1973, 19 (02) : 125 - 132
[2] X-RAY MOIRE TOPOGRAPHY OF LATTICE DEFECTS IN QUARTZ
LANG, AR
NATURE, 1968, 220 (5168) : 652 - &
[3] X-RAY MOIRE TOPOGRAPHY OF LATTICE DEFECTS IN QUARTZ
CHEN, LW
LANG, AR
ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1969, A 25 : S205 - &
[4] X-RAY TOPOGRAPHIC DEFECTS CONTRAST ON SYNTHETIC QUARTZ
CHIRILA, R
CSIKI, Z
CRYSTAL RESEARCH AND TECHNOLOGY, 1993, 28 (05) : 615 - 621
[5] OBSERVATION OF GROWTH DEFECTS IN SPODUMENE CRYSTALS BY X-RAY TOPOGRAPHY
AUTHIER, A
ZARKA, A
PHYSICS AND CHEMISTRY OF MINERALS, 1977, 1 (01) : 15 - 26
[6] GROWTH DEFECTS OF NATURAL BERYLS OBSERVED BY X-RAY TOPOGRAPHY
JIANG, SS
LI, Q
XU, XY
JOURNAL OF CRYSTAL GROWTH, 1992, 116 (1-2) : 93 - 97
[7] OBSERVATION OF GROWTH DEFECTS IN BERYL CRYSTALS BY X-RAY TOPOGRAPHY
SCANDALE, E
SCORDARI, F
ZARKA, A
ACTA CRYSTALLOGRAPHICA SECTION A, 1978, 34 : S255 - S256
[8] X-ray diffraction imaging of defects in topography (microscopy) studies
Suvorov, E. V.
Smirnova, I. A.
PHYSICS-USPEKHI, 2015, 58 (09) : 833 - 849
[9] MORPHOGENETICAL CHARACTERIZATION OF THE BRAZIL TWIN APPEARING IN - X AND Z' GROWTH SECTORS OF SYNTHETIC QUARTZ CRYSTALS BY X-RAY TOPOGRAPHY
GONZALEZMANAS, M
CABALLERO, MA
JOURNAL OF CRYSTAL GROWTH, 1991, 113 (3-4) : 669 - 680
[10] STROBOSCOPIC X-RAY TOPOGRAPHY OF QUARTZ RESONATORS
ZARKA, A
CAPELLE, B
DETAINT, J
SCHWARTZEL, J
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1988, 21 : 967 - 971

← 1 2 3 4 5 →