SCANNING TUNNELING MICROSCOPY;
HIGHLY ORIENTED PYROLYTIC GRAPHITE;
GOLD;
AUGER ELECTRON SPECTROSCOPY;
ELECTRON SPECTROSCOPY FOR CHEMICAL ANALYSIS;
BIOMOLECULES;
DEOXYRIBONUCLEIC ACID;
D O I:
暂无
中图分类号:
TH742 [显微镜];
学科分类号:
摘要:
The current status of biological Scanning Tunneling Microscopy (STM) investigations and the importance of using a well-characterized substrate are discussed. The findings of over two years of experiments and over 1,000 images obtained on gold substrates prepared by a variety of different methods are statistically summarized and compared to a very flat reference substrate, highly oriented pyrolytic graphite (HOPG). In an effort to begin to corroborate STM results with those obtained from other more established techniques, the results of Auger Electron Spectroscopy (AES) and Electron Spectroscopy for Chemical Analysis (ESCA) of biomolecular STM samples are presented.
机构:
Tokyo Univ Sci, Fac Ind Sci & Technol, Dept Appl Elect, Chiba 2788510, Japan
Tokyo Univ Sci, Fac Sci & Technol, Dept Phys, Chiba 2788510, JapanTokyo Univ Sci, Fac Ind Sci & Technol, Dept Appl Elect, Chiba 2788510, Japan
Hara, Shinsuke
Kobayashi, Hidekazu
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Tokyo Univ Sci, Fac Sci & Technol, Dept Phys, Chiba 2788510, JapanTokyo Univ Sci, Fac Ind Sci & Technol, Dept Appl Elect, Chiba 2788510, Japan
Kobayashi, Hidekazu
Ota, Kohei
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Tokyo Univ Sci, Fac Ind Sci & Technol, Dept Appl Elect, Chiba 2788510, JapanTokyo Univ Sci, Fac Ind Sci & Technol, Dept Appl Elect, Chiba 2788510, Japan
Ota, Kohei
Nagura, Yuichiro
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Tokyo Univ Sci, Fac Sci & Technol, Dept Phys, Chiba 2788510, JapanTokyo Univ Sci, Fac Ind Sci & Technol, Dept Appl Elect, Chiba 2788510, Japan
Nagura, Yuichiro
Irokawa, Katsumi
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Tokyo Univ Sci, Fac Sci & Technol, Dept Phys, Chiba 2788510, JapanTokyo Univ Sci, Fac Ind Sci & Technol, Dept Appl Elect, Chiba 2788510, Japan
Irokawa, Katsumi
Fujishiro, Hiroki Inomata
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Tokyo Univ Sci, Fac Ind Sci & Technol, Dept Appl Elect, Chiba 2788510, JapanTokyo Univ Sci, Fac Ind Sci & Technol, Dept Appl Elect, Chiba 2788510, Japan
Fujishiro, Hiroki Inomata
Watanabe, Kazuyuki
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h-index: 0
机构:
Tokyo Univ Sci, Fac Sci, Dept Phys, Shinjuku Ku, Tokyo 1628601, JapanTokyo Univ Sci, Fac Ind Sci & Technol, Dept Appl Elect, Chiba 2788510, Japan
Watanabe, Kazuyuki
Miki, Hirofumi
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机构:
Tokyo Univ Sci, Fac Sci & Technol, Dept Phys, Chiba 2788510, JapanTokyo Univ Sci, Fac Ind Sci & Technol, Dept Appl Elect, Chiba 2788510, Japan
Miki, Hirofumi
Kawazu, Akira
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h-index: 0
机构:
Tokyo Univ Sci, Fac Sci & Technol, Dept Phys, Chiba 2788510, JapanTokyo Univ Sci, Fac Ind Sci & Technol, Dept Appl Elect, Chiba 2788510, Japan
机构:
JOINT RES CTR ATOM TECHNOL,NATL INST ADV INTERDISCIPLINARY RES,TSUKUBA,IBARAKI 305,JAPANJOINT RES CTR ATOM TECHNOL,NATL INST ADV INTERDISCIPLINARY RES,TSUKUBA,IBARAKI 305,JAPAN
Gwo, S
Miwa, S
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h-index: 0
机构:
JOINT RES CTR ATOM TECHNOL,NATL INST ADV INTERDISCIPLINARY RES,TSUKUBA,IBARAKI 305,JAPANJOINT RES CTR ATOM TECHNOL,NATL INST ADV INTERDISCIPLINARY RES,TSUKUBA,IBARAKI 305,JAPAN
Miwa, S
Ohno, H
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h-index: 0
机构:
JOINT RES CTR ATOM TECHNOL,NATL INST ADV INTERDISCIPLINARY RES,TSUKUBA,IBARAKI 305,JAPANJOINT RES CTR ATOM TECHNOL,NATL INST ADV INTERDISCIPLINARY RES,TSUKUBA,IBARAKI 305,JAPAN
Ohno, H
Fan, JF
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h-index: 0
机构:
JOINT RES CTR ATOM TECHNOL,NATL INST ADV INTERDISCIPLINARY RES,TSUKUBA,IBARAKI 305,JAPANJOINT RES CTR ATOM TECHNOL,NATL INST ADV INTERDISCIPLINARY RES,TSUKUBA,IBARAKI 305,JAPAN
Fan, JF
Tokumoto, H
论文数: 0引用数: 0
h-index: 0
机构:
JOINT RES CTR ATOM TECHNOL,NATL INST ADV INTERDISCIPLINARY RES,TSUKUBA,IBARAKI 305,JAPANJOINT RES CTR ATOM TECHNOL,NATL INST ADV INTERDISCIPLINARY RES,TSUKUBA,IBARAKI 305,JAPAN
Tokumoto, H
ICDS-18 - PROCEEDINGS OF THE 18TH INTERNATIONAL CONFERENCE ON DEFECTS IN SEMICONDUCTORS, PTS 1-4,
1995,
196-
: 1949
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1953