EXAMINATION OF THE AL/AL2O3 INTERFACE BY HIGH-RESOLUTION ELECTRON-MICROSCOPY

被引：6

作者：

TIMSIT, RS ^{[1
]}

WADDINGTON, WG ^{[1
]}

HUMPHREYS, CJ ^{[1
]}

HUTCHISON, JL ^{[1
]}

机构：

[1] UNIV OXFORD,DEPT MET & SCI MAT,OXFORD OX1 3PH,ENGLAND

来源：

ULTRAMICROSCOPY | 1985年 / 18卷 / 1-4期

关键词：

D O I：

10.1016/0304-3991(85)90157-3

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

收藏

页码：387 / 394

页数：8

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