X-RAY PHOTOELECTRON STUDY OF THE SURFACE OF INORGANIC MATERIALS

被引：0

作者：

NEFEDOV, VI

机构：

来源：

INORGANIC MATERIALS | 1984年 / 20卷 / 06期

关键词：

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：819 / 825

页数：7

共 10 条

[1] HIGH-RESOLUTION X-RAY PHOTOELECTRON-SPECTROSCOPY AS A PROBE OF LOCAL ATOMIC-STRUCTURE - APPLICATION TO AMORPHOUS SIO2 AND THE SI-SIO2 INTERFACE [J].

GRUNTHANER, FJ ;

GRUNTHANER, PJ ;

VASQUEZ, RP ;

LEWIS, BF ;

MASERJIAN, J ;

MADHUKAR, A .

PHYSICAL REVIEW LETTERS, 1979, 43 (22) :1683-1686

[2] CHEMICAL DEPTH PROFILES OF THE GAAS-NATIVE OXIDE INTERFACE [J].

GRUNTHANER, PJ ;

VASQUEZ, RP ;

GRUNTHANER, FJ .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1980, 17 (05) :1045-1051

[3]

MINACHEV KM, 1981, PHOTOELECTRON SPECTR

[4]

NEFEDOV VI, 1973, SER STRUCTURE MOL CH

[5]

NEFEDOV VI, 1983, PHYSICAL METHODS STU

[6]

NEMOSHKALENKO VV, 1976, ELECTRON SPECTROSCOP

[7] X-RAY PHOTOELECTRON-SPECTROSCOPY STUDY OF NATIVE OXIDES ON GAAS [J].

SCHWARTZ, GP ;

GUALTIERI, GJ ;

KAMMLOTT, GW ;

SCHWARTZ, B .

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1979, 126 (10) :1737-1749

[8]

SHABANOV IN, 1977, PHYSICS ELECTRONICS, P191

[9]

SHABANOVA IN, 1976, FIZ MET METALLOVED+, V42, P318

[10]

TANANAEV IV, 1971, IZV AKAD NAUK SSSR N, V7

← 1 →