MATURITY FACTORS IN PREDICTING FAILURE RATE FOR LINEAR INTEGRATED-CIRCUITS

被引：1

|

作者：

PANTIC, DM

机构：

来源：

IEEE TRANSACTIONS ON RELIABILITY | 1984年 / 33卷 / 03期

关键词：

D O I：

10.1109/TR.1984.5221790

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

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页码：208 / 212

页数：5

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