DEVELOPMENTS IN CONVERGENT BEAM ELECTRON-DIFFRACTION

被引:0
作者
STEEDS, JW
VINCENT, R
机构
来源
JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES | 1983年 / 8卷 / 06期
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:419 / &
相关论文
共 50 条
[21]   CRYSTALLOGRAPHIC INFORMATION FROM CONVERGENT BEAM ELECTRON-DIFFRACTION [J].
STEEDS, JW .
ULTRAMICROSCOPY, 1981, 7 (01) :105-106
[22]   CONVERGENT BEAM ELECTRON-DIFFRACTION AND THE DETERMINATION OF CRYSTAL SYMMETRY [J].
MUDDLE, BC .
METALS FORUM, 1985, 8 (2-3) :93-108
[23]   INTRODUCTION TO THE THEORY AND THE PRACTICE OF CONVERGENT BEAM ELECTRON-DIFFRACTION [J].
THOMAS, BJ ;
PORTIER, R ;
GANDAIS, M .
JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1983, 8 (06) :343-399
[24]   INVERSION OF CONVERGENT-BEAM ELECTRON-DIFFRACTION PATTERNS [J].
BIRD, DM ;
SAUNDERS, M .
ACTA CRYSTALLOGRAPHICA SECTION A, 1992, 48 :555-562
[25]   Developments in quantitative convergent beam electron diffraction (CBED) [J].
Saunders, M .
MICROBEAM ANALYSIS 2000, PROCEEDINGS, 2000, (165) :205-206
[26]   STUDY ON BARIUM-TITANATE BY CONVERGENT BEAM ELECTRON-DIFFRACTION [J].
TANAKA, M ;
LEHMPFUH.G .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1972, 11 (11) :1755-&
[27]   AN IMPROVED PHOTOGRAPHIC PROCESS FOR CONVERGENT BEAM ELECTRON-DIFFRACTION APPLICATIONS [J].
TURNER, JH ;
KRISHNAN, KM .
JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1987, 5 (02) :211-215
[28]   INFORMATION ON SYMMETRY ANALYSIS BY CONVERGENT-BEAM ELECTRON-DIFFRACTION [J].
TANAKA, M .
JOURNAL OF ELECTRON MICROSCOPY, 1989, 38 (01) :72-72
[29]   SOME APPLICATIONS OF CONVERGENT BEAM ELECTRON-DIFFRACTION IN METALLURGICAL RESEARCH [J].
RAGHAVAN, M ;
KOO, JY ;
PETKOVICLUTON, R .
JOURNAL OF METALS, 1983, 35 (06) :44-50
[30]   COMPUTER-SIMULATION OF CONVERGENT BEAM ELECTRON-DIFFRACTION PATTERNS [J].
BLOM, NS ;
SCHAPINK, FW .
ACTA CRYSTALLOGRAPHICA SECTION A, 1984, 40 :C383-C383