THE MIGRATION OF GOLD FROM THE P-CONTACT AS A SOURCE OF DARK SPOT DEFECTS IN INP/INGAASP LEDS

被引：21
作者：
CHIN, AK
ZIPFEL, CL
ERMANIS, F
MARCHUT, L
CAMLIBEL, I
DIGIUSEPPE, MA
CHIN, BH
机构：
来源：
IEEE TRANSACTIONS ON ELECTRON DEVICES | 1983年 / 30卷 / 04期
关键词：
D O I：
10.1109/T-ED.1983.21121
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：304 / 310
页数：7
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