MILLIMETER-WAVE IMPATT DIODES WITH IMPROVED EFFICIENCY BY USING ION-IMPLANTED OHMIC CONTACT

被引:1
作者
HIRACHI, Y [1 ]
NISHI, H [1 ]
SHINODA, M [1 ]
FUKUKAWA, Y [1 ]
机构
[1] FUJITSU LABS LTD,1015 KAMIKODANAKA,NAKAHARA,JAPAN
关键词
D O I
10.1109/PROC.1975.9953
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:1367 / 1368
页数:2
相关论文
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Nelson R. S., 1969, Radiation Effects, V2, P47, DOI 10.1080/00337576908235579
[2]   METALLIZATION SYSTEMS FOR SILICON INTEGRATED CIRCUITS [J].
TERRY, LE ;
WILSON, RW .
PROCEEDINGS OF THE IEEE, 1969, 57 (09) :1580-&
[3]  
4699232