HYDROGEN PASSIVATION OF ACCEPTORS IN P-INP

被引:66
作者
DAUTREMONTSMITH, WC
LOPATA, J
PEARTON, SJ
KOSZI, LA
STAVOLA, M
SWAMINATHAN, V
机构
关键词
D O I
10.1063/1.344508
中图分类号
O59 [应用物理学];
学科分类号
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页码:1993 / 1996
页数:4
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共 20 条
[1]   PASSIVATION OF ZINC ACCEPTORS IN INP BY ATOMIC-HYDROGEN COMING FROM ARSINE DURING METALORGANIC VAPOR-PHASE EPITAXY [J].
ANTELL, GR ;
BRIGGS, ATR ;
BUTLER, BR ;
KITCHING, SA ;
STAGG, JP ;
CHEW, A ;
SYKES, DE .
APPLIED PHYSICS LETTERS, 1988, 53 (09) :758-760
[2]   HYDROGEN PLASMA-ETCHING OF SEMICONDUCTORS AND THEIR OXIDES [J].
CHANG, RPH ;
CHANG, CC ;
DARACK, S .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1982, 20 (01) :45-50
[3]   DONOR NEUTRALIZATION IN GAAS(SI) BY ATOMIC-HYDROGEN [J].
CHEVALLIER, J ;
DAUTREMONTSMITH, WC ;
TU, CW ;
PEARTON, SJ .
APPLIED PHYSICS LETTERS, 1985, 47 (02) :108-110
[4]  
CHEVALLIER J, 1988, 15TH INT C DEF SEM B
[5]   EVIDENCE FOR COMPLEXES OF HYDROGEN WITH DEEP-LEVEL DEFECTS IN BULK III-V MATERIALS [J].
CLERJAUD, B ;
COTE, D ;
NAUD, C .
PHYSICAL REVIEW LETTERS, 1987, 58 (17) :1755-1757
[6]   EFFECT OF COOLING AMBIENT ON ELECTRICAL ACTIVATION OF DOPANTS IN MOVPE OF INP [J].
COLE, S ;
EVANS, JS ;
HARLOW, MJ ;
NELSON, AW ;
WONG, S .
ELECTRONICS LETTERS, 1988, 24 (15) :929-931
[7]   PASSIVATION OF DEEP LEVEL DEFECTS IN MOLECULAR-BEAM EPITAXIAL GAAS BY HYDROGEN PLASMA EXPOSURE [J].
DAUTREMONTSMITH, WC ;
NABITY, JC ;
SWAMINATHAN, V ;
STAVOLA, M ;
CHEVALLIER, J ;
TU, CW ;
PEARTON, SJ .
APPLIED PHYSICS LETTERS, 1986, 49 (17) :1098-1100
[8]   PASSIVATION OF ACCEPTORS IN INP RESULTING FROM CH4/H2 REACTIVE ION ETCHING [J].
HAYES, TR ;
DAUTREMONTSMITH, WC ;
LUFTMAN, HS ;
LEE, JW .
APPLIED PHYSICS LETTERS, 1989, 55 (01) :56-58
[9]   HYDROGEN PASSIVATION OF SHALLOW-ACCEPTOR IMPURITIES IN PARA-TYPE GAAS [J].
JOHNSON, NM ;
BURNHAM, RD ;
STREET, RA ;
THORNTON, RL .
PHYSICAL REVIEW B, 1986, 33 (02) :1102-1105
[10]   PASSIVATION OF THE DOMINANT DEEP LEVEL (EL2) IN GAAS BY HYDROGEN [J].
LAGOWSKI, J ;
KAMINSKA, M ;
PARSEY, JM ;
GATOS, HC ;
LICHTENSTEIGER, M .
APPLIED PHYSICS LETTERS, 1982, 41 (11) :1078-1080