X-RAY TOPOGRAPHIC DETERMINATION OF INTRINSIC OR EXTRINSIC NATURE OF STACKING-FAULTS

被引：23

作者：

AUTHIER, A

PATEL, JR

机构：

[1] UNIV PARIS 06, CNRS, LAB MINERAL CRISTALLOG, PARIS, FRANCE

[2] BELL TEL LABS INC, MURRAY HILL, NJ USA

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1975年 / 27卷 / 01期

关键词：

D O I：

10.1002/pssa.2210270125

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：213 / 222

页数：10

共 9 条

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[3] X-RAY DIFFRACTION CONTRAST OF INVERSION TWIN BOUNDARIES IN BEO CRYSTALS
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AUSTERMAN, SB
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1968, 1 : 165 - +
[4] VISUALIZATION OF PHOTOGRAPHS ON A RAPID IMPRINT OF A COMPUTER - APPLICATION TO STIMULATION OF TOPOGRAPHS IN FIXED POSE BY METHOD OF LANG
EPELBOIN, Y
LIFCHITZ, A
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1974, 7 (JUN1) : 377 - 382
[5] Kato N., 1967, ADV X-RAY ANAL, V10, P46
[6] DETERMINING SIGN OF FAULT VECTORS BY X-RAY TOPOGRAPHY
LANG, AR
[J]. ZEITSCHRIFT FUR NATURFORSCHUNG PART A-ASTROPHYSIK PHYSIK UND PHYSIKALISCHE CHEMIE, 1972, A 27 (03): : 461 - &
[7] X-RAY ANOMALOUS TRANSMISSION AND TOPOGRAPHY OF OXYGEN PRECIPITATION IN SILICON
PATEL, JR
[J]. JOURNAL OF APPLIED PHYSICS, 1973, 44 (09) : 3903 - 3906
[8] PATEL JR, 1975, J APPL PHY JAN
[9] WONSIEWICZ BC, 1975, J APPL CRYST