MEASUREMENTS OF THE SECONDARY-ELECTRON EMISSION OF SUPERCONDUCTING TRANSITIONS AT HELIUM TEMPERATURES BY SCANNING ELECTRON-MICROSCOPY

被引：0
|
作者：
TOMASHPOLSKII, YY
SADOVSKAYA, NV
SEVOSTYANOV, MA
NEKHOROSHEV, NS
PRUTCHENKO, SG
KOCHETOV, AK
机构：
来源：
INDUSTRIAL LABORATORY | 1995年 / 61卷 / 01期
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D O I：
暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
For the first time the abrupt minimum of the SEE yield from a Bi-Sr-Ca-Cu-O ceramic was observed in the vicinity of the superconducting transition. After proper metrological testing, this effect can be used as a basis for a new, sensitive, contactless method for determining a superconducting transition that is local in area and depth.
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页码：23 / 25
页数：3
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