MEASUREMENT OF GRAZING-INCIDENCE X-RAY-DIFFRACTION SCATTERING WITH A POSITION-SENSITIVE DETECTOR

被引：0
|
作者：
LOMOV, AA
NOVIKOV, DV
GOGANOV, DA
GUTKEVICH, SM
机构：
来源：
FIZIKA TVERDOGO TELA | 1988年 / 30卷 / 10期
关键词：
D O I：
暂无
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
引用
收藏
页码：2881 / 2884
页数：4
相关论文
共 50 条
  • [1] AN ULTRASOFT X-RAY POSITION-SENSITIVE DETECTOR FOR GRAZING-INCIDENCE SPECTROMETER
    ALAVERDOV, VI
    STEPANOV, AP
    SHULAKOV, AS
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1992, 35 (02) : 238 - 241
  • [2] X-RAY-DIFFRACTION TEXTURE ANALYSIS WITH A POSITION-SENSITIVE DETECTOR
    WCISLAK, L
    BUNGE, HJ
    NAUERGERHARDT, CU
    ZEITSCHRIFT FUR METALLKUNDE, 1993, 84 (07): : 479 - 493
  • [3] KINEMATIC THEORY OF GRAZING-INCIDENCE X-RAY-DIFFRACTION
    ANDREEVA, MA
    VESTNIK MOSKOVSKOGO UNIVERSITETA SERIYA 3 FIZIKA ASTRONOMIYA, 1989, 30 (03): : 52 - 57
  • [4] MBE APPARATUS FOR INSITU GRAZING-INCIDENCE X-RAY-DIFFRACTION
    AKIMOTO, K
    MIZUKI, J
    HIROSAWA, I
    MATSUI, J
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1989, 60 (07): : 2362 - 2364
  • [5] STUDIES OF SEMICONDUCTOR INTERFACES BY GRAZING-INCIDENCE X-RAY-DIFFRACTION
    MATSUI, J
    MIZUKI, J
    ANNUAL REVIEW OF MATERIALS SCIENCE, 1993, 23 : 295 - 320
  • [6] INTERFACIAL SUPERSTRUCTURES STUDIED BY GRAZING-INCIDENCE X-RAY-DIFFRACTION
    AKIMOTO, K
    MIZUKI, J
    HIROSAWA, I
    MATSUI, J
    APPLIED SURFACE SCIENCE, 1989, 41-2 : 317 - 322
  • [7] A MATRIX APPROACH TO GRAZING-INCIDENCE X-RAY-DIFFRACTION IN MULTILAYERS
    STEPANOV, SA
    PIETSCH, U
    BAUMBACH, GT
    ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER, 1995, 96 (03): : 341 - 347
  • [8] GRAZING-INCIDENCE BRAGG-LAUE X-RAY-DIFFRACTION
    DURBIN, SM
    GOG, T
    ACTA CRYSTALLOGRAPHICA SECTION A, 1989, 45 : 132 - 141
  • [9] A POSITION-SENSITIVE DETECTOR SYSTEM FOR THE MEASUREMENT OF DIFFUSE-X-RAY SCATTERING
    OSBORN, JC
    WELBERRY, TR
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1990, 23 : 476 - 484
  • [10] INVESTIGATION OF A SEMICONDUCTOR SUPERLATTICE BY USE OF GRAZING-INCIDENCE X-RAY-DIFFRACTION
    PIETSCH, U
    SEIFERT, W
    FORNELL, JO
    RHAN, H
    METZGER, H
    RUGEL, S
    PEISL, J
    APPLIED SURFACE SCIENCE, 1992, 54 : 502 - 506
12345