ANGLE AND INDEX CALCULATIONS FOR A Z-AXIS X-RAY DIFFRACTOMETER

被引：54

作者：

BLOCH, JM

机构：

[1] Brookhaven Natl Lab, Natl, Synchrotron Light Source, Upton, NY,, USA, Brookhaven Natl Lab, Natl Synchrotron Light Source, Upton, NY, USA

来源：

关键词：

D O I：

10.1107/S0021889885009724

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：33 / 36

页数：4

共 9 条

[1] PROGRAMMED ELECTRONIC X-RAY AUTOMATIC DIFFRACTOMETER [J].

ABRAHAMS, SC .

[2]

[Anonymous], 1942, XRAY CRYSTALLOGRAPHY

[3]

ARNDT UW, 1966, SINGLE CRYSTAL DIFFR

BUSING, WR ;

LEVY, HA .

[5] THE ADAPTATION OF A GEIGER COUNTER TO THE WEISSENBERG CAMERA [J].

CLIFTON, DF ;

FILLER, A ;

MCLACHLAN, D .

COCHRAN, W .

EVANS, HT .

[8]

Patterson A.L., 1959, INT TABLES XRAY CRYS, VII, P61

TICHY, K .