共 50 条
- [35] On the Effect of Interface Traps on the Carrier Distribution Function During Hot-Carrier Degradation 2016 IEEE INTERNATIONAL INTEGRATED RELIABILITY WORKSHOP (IIRW), 2016, : 95 - 98
- [39] Effects of hot-carrier stress on the performance of CMOS low noise amplifier 2004 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS, 2004, : 417 - 421