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- [8] COMPUTER-CONTROLLED TIME-OF-FLIGHT ATOM-PROBE FIELD-ION MICROSCOPE FOR STUDY OF DEFECTS IN METALS JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1977, 10 (09): : 884 - 893
- [9] NUMERICAL-CALCULATION OF THE TEMPERATURE EVOLUTION AND PROFILE OF THE FIELD-ION EMITTER IN THE PULSED-LASER TIME-OF-FLIGHT ATOM PROBE REVIEW OF SCIENTIFIC INSTRUMENTS, 1984, 55 (11): : 1779 - 1784
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