AC SUSCEPTIBILITY RESPONSE OF THIN-FILM SUPERCONDUCTORS NEAR TC - A THEORETICAL-STUDY

被引：69

作者：

SUN, JZ

SCHAREN, MJ

BOURNE, LC

SCHRIEFFER, JR

机构：

[1] Superconductor Technologies, Inc., Santa Barbara, CA 93111-2310

来源：

PHYSICAL REVIEW B | 1991年 / 44卷 / 10期

关键词：

D O I：

10.1103/PhysRevB.44.5275

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We present a quantitative analysis of the ac susceptibility response of thin-film type-II superconductors near T(c), using a description based on the Bean critical-state model. The shape of the ac susceptibility transition is determined by the temperature dependence of the critical current density of the film. The ac-field-amplitude dependence of the susceptibility response is also given.

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页码：5275 / 5279

页数：5

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