MILLIMETER-WAVE DIELECTRIC MEASUREMENT OF MATERIALS

被引:92
作者
AFSAR, MN [1 ]
BUTTON, KJ [1 ]
机构
[1] MIT,LINCOLN LAB,LEXINGTON,MA 02173
关键词
D O I
10.1109/PROC.1985.13114
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:131 / 153
页数:23
相关论文
共 74 条
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[2]  
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[8]   MILLIMETER AND SUBMILLIMETER WAVE MEASUREMENTS OF COMPLEX OPTICAL AND DIELECTRIC PARAMETERS OF MATERIALS .1. 2.5 MM TO 0.66 MM FOR ALUMINA-995, BERYLLIA, FUSED-SILICA, BORO-SILICATE AND GLASS CERAMIC [J].
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