MILLIMETER-WAVE DIELECTRIC MEASUREMENT OF MATERIALS

[1] Afsar M. N., 1977, IEEE Transactions on Microwave Theory and Techniques, VMTT-25, P509, DOI 10.1109/TMTT.1977.1129147

[2] Afsar M. N., 1979, Fourth International Conference on Infrared and Millimeter Waves and their Applications, P191

[3] NEW TECHNIQUES FOR DISPERSIVE FOURIER-TRANSFORM SPECTROMETRY OF LIQUIDS [J]. INFRARED PHYSICS, 1976, 16 (1-2): : 301 - 310

[4] SUBMILLIMETER WAVE MEASUREMENTS OF OPTICAL-CONSTANTS OF WATER AT VARIOUS TEMPERATURES [J]. INFRARED PHYSICS, 1978, 18 (5-6): : 835 - 841

[5] HIGH-PRECISION DIELECTRIC MEASUREMENTS ON LIQUIDS AND SOLIDS AT MILLIMETER AND SUBMILLIMETER WAVELENGTHS [J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1976, 25 (04) : 290 - 294

[6] SUBMILLIMETER-WAVE MEASUREMENTS ON LIQUID DIELECTRICS [J]. PROCEEDINGS OF THE IEEE, 1979, 67 (10) : 1460 - 1463

[7] ASSESSMENT OF RANDOM AND SYSTEMATIC-ERRORS IN MICROWAVE AND SUBMILLIMETER DIELECTRIC MEASUREMENTS [J]. PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON, 1977, 124 (06): : 575 - 577

[8] MILLIMETER AND SUBMILLIMETER WAVE MEASUREMENTS OF COMPLEX OPTICAL AND DIELECTRIC PARAMETERS OF MATERIALS .1. 2.5 MM TO 0.66 MM FOR ALUMINA-995, BERYLLIA, FUSED-SILICA, BORO-SILICATE AND GLASS CERAMIC [J]. INTERNATIONAL JOURNAL OF INFRARED AND MILLIMETER WAVES, 1981, 2 (05): : 1029 - 1044

[9] MEASUREMENTS OF OPTICAL-CONSTANTS OF LIQUID H2O AND D2O BETWEEN 6 AND 450 CM-1 [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1977, 67 (07) : 902 - 904

[10] PRECISE MILLIMETER-WAVE MEASUREMENTS OF COMPLEX REFRACTIVE-INDEX, COMPLEX DIELECTRIC PERMITTIVITY AND LOSS TANGENT OF GAAS, SI, SIO2, AL2O3, BEO, MACOR, AND GLASS [J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1983, 31 (02) : 217 - 223

[1] Afsar M. N., 1977, IEEE Transactions on Microwave Theory and Techniques, VMTT-25, P509, DOI 10.1109/TMTT.1977.1129147

[2] Afsar M. N., 1979, Fourth International Conference on Infrared and Millimeter Waves and their Applications, P191

[3] NEW TECHNIQUES FOR DISPERSIVE FOURIER-TRANSFORM SPECTROMETRY OF LIQUIDS [J]. INFRARED PHYSICS, 1976, 16 (1-2): : 301 - 310

[4] SUBMILLIMETER WAVE MEASUREMENTS OF OPTICAL-CONSTANTS OF WATER AT VARIOUS TEMPERATURES [J]. INFRARED PHYSICS, 1978, 18 (5-6): : 835 - 841

[5] HIGH-PRECISION DIELECTRIC MEASUREMENTS ON LIQUIDS AND SOLIDS AT MILLIMETER AND SUBMILLIMETER WAVELENGTHS [J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1976, 25 (04) : 290 - 294

[6] SUBMILLIMETER-WAVE MEASUREMENTS ON LIQUID DIELECTRICS [J]. PROCEEDINGS OF THE IEEE, 1979, 67 (10) : 1460 - 1463

[7] ASSESSMENT OF RANDOM AND SYSTEMATIC-ERRORS IN MICROWAVE AND SUBMILLIMETER DIELECTRIC MEASUREMENTS [J]. PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON, 1977, 124 (06): : 575 - 577

[8] MILLIMETER AND SUBMILLIMETER WAVE MEASUREMENTS OF COMPLEX OPTICAL AND DIELECTRIC PARAMETERS OF MATERIALS .1. 2.5 MM TO 0.66 MM FOR ALUMINA-995, BERYLLIA, FUSED-SILICA, BORO-SILICATE AND GLASS CERAMIC [J]. INTERNATIONAL JOURNAL OF INFRARED AND MILLIMETER WAVES, 1981, 2 (05): : 1029 - 1044

[9] MEASUREMENTS OF OPTICAL-CONSTANTS OF LIQUID H2O AND D2O BETWEEN 6 AND 450 CM-1 [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1977, 67 (07) : 902 - 904

[10] PRECISE MILLIMETER-WAVE MEASUREMENTS OF COMPLEX REFRACTIVE-INDEX, COMPLEX DIELECTRIC PERMITTIVITY AND LOSS TANGENT OF GAAS, SI, SIO2, AL2O3, BEO, MACOR, AND GLASS [J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1983, 31 (02) : 217 - 223