COMPOSITION DEPENDENCE OF BREMSSTRAHLUNG BACKGROUND IN ELECTRON-PROBE X-RAY-MICROANALYSIS

被引：48

作者：

MARKOWICZ, AA ^{[1
]}

VANGRIEKEN, RE ^{[1
]}

机构：

[1] UNIV INSTELLING ANTWERP,DEPT CHEM,B-2610 WILRIJK,BELGIUM

来源：

关键词：

D O I：

10.1021/ac00276a016

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：2049 / 2051

页数：3

共 17 条

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[2] FIORI CE, 1982, P ANN C MICROBEAM AN, V17, P57
[3] GOLDSTEIN JI, 1981, SCANNING ELECTRON MI
[4] On the theory of X-ray absorption and of the continuous X- ray spectrum
Kramers, HA
[J]. PHILOSOPHICAL MAGAZINE, 1923, 46 (275): : 836 - 871
[5] LIFSHIN E, 1976, ADV XRAY ANALYSIS, V19, P113
[6] MYKLEBUST RL, 1980, P ANN C MICROBEAM AN, V15, P49
[7] RAOSAHIB TS, 1972, 6TH P INT C XRAY OPT, P131
[8] SHAPE OF CONTINUOUS X-RAY-SPECTRUM AND BACKGROUND CORRECTIONS FOR ENERGY-DISPERSIVE ELECTRON-MICROPROBE ANALYSIS
REED, SJB
[J]. X-RAY SPECTROMETRY, 1975, 4 (01) : 14 - 17
[9] BACKGROUND CORRECTION FOR ENERGY-DISPERSIVE X-RAY ANALYSIS OF THIN-SECTIONS
SHERRY, WM
VANDERSANDE, JB
[J]. X-RAY SPECTROMETRY, 1977, 6 (03) : 154 - 160
[10] SMALL JA, 1979, SCANNING ELECTRON MI, V2, P807