COMPOSITION DEPENDENCE OF BREMSSTRAHLUNG BACKGROUND IN ELECTRON-PROBE X-RAY-MICROANALYSIS

被引：48
作者：
MARKOWICZ, AA [1 ]
VANGRIEKEN, RE [1 ]
机构：
[1] UNIV INSTELLING ANTWERP,DEPT CHEM,B-2610 WILRIJK,BELGIUM
来源：
ANALYTICAL CHEMISTRY | 1984年 / 56卷 / 12期
关键词：
D O I：
10.1021/ac00276a016
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
引用
收藏
页码：2049 / 2051
页数：3
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