A COMPARISON BETWEEN PIXE AND RBS THIN-FILM THICKNESS MEASUREMENTS IN BINARY TARGETS

被引：13

|

作者：

OLIVER, A

MIRANDA, J

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1987年 / 29卷 / 03期

关键词：

D O I：

10.1016/0168-583X(87)90063-2

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

收藏

页码：521 / 526

页数：6

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