共 50 条
- [1] X-RAY DOUBLE CRYSTAL MEASUREMENTS OF LATTICE-PARAMETERS CHANGES OF FACETS IN GGG CRYSTALS KRISTALL UND TECHNIK-CRYSTAL RESEARCH AND TECHNOLOGY, 1980, 15 (06): : K57 - K59
- [2] A DOUBLE-CRYSTAL SOFT X-RAY SPECTROMETER ACTA POLYTECHNICA SCANDINAVICA-PHYSICS INCLUDING NUCLEONICS SERIES, 1970, (71): : 1 - &
- [3] MEASUREMENTS OF LATTICE-PARAMETERS AND HALF-WIDTHS OF THE ROCKING CURVE ON GAAS CRYSTAL BY THE X-RAY DOUBLE-CRYSTAL METHOD USING A CU K-ALPHA DOUBLET JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1988, 27 (03): : 442 - 443
- [6] AN AUTOMATIC SCANNING DEVICE FOR X-RAY DIFFRACTION MEASUREMENTS WITH A DOUBLE-CRYSTAL SPECTROMETER ARKIV FOR FYSIK, 1968, 37 (04): : 376 - &
- [7] Design of a double-crystal x-ray vacuum spectrometer PHYSICAL REVIEW, 1932, 41 (05): : 553 - 560
- [8] AN AUTOMATIC SCANNING DEVICE FOR X-RAY DIFFRACTION MEASUREMENTS WITH A DOUBLE-CRYSTAL SPECTROMETER ARKIV FOR FYSIK, 1968, 38 (03): : 233 - &
- [9] Direct measurement of InGaAs/GaAs lattice relaxation by double-crystal X-ray diffraction Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors, 1997, 18 (07): : 508 - 512
- [10] AN AUTOMATIC FLANK CONTROL FOR DOUBLE-CRYSTAL X-RAY TOPOGRAPHY JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1981, 14 (11): : 1248 - 1249