X-RAY PHOTOELECTRON AND AUGER-ELECTRON SPECTRA OF MAGNESIUM THIN-FILMS

被引：6

作者：

HALDER, NC ^{[1
]}

ALONSO, J ^{[1
]}

SWARTZ, WE ^{[1
]}

机构：

[1] UNIV S FLORIDA,DEPT PHYS,TAMPA,FL 33620

来源：

THIN SOLID FILMS | 1976年 / 34卷 / 01期

关键词：

D O I：

10.1016/0040-6090(76)90142-5

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：99 / 102

页数：4

共 18 条

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HALDER NC, TO BE PUBLISHED

[7] QUANTITATIVE-DETERMINATION OF SURFACE OXIDE THICKNESS ON DEPOSITED METAL-FILMS BY COMBINATION AUGER SPECTROSCOPY AND INERT-GAS ION-BOMBARDMENT [J].

HOLLOWAY, DM .

APPLIED SPECTROSCOPY, 1973, 27 (02) :95-98

[8] COMPARATIVE STUDY OF SINGLE-CRYSTAL MAGNESIUM-OXIDE AND OXIDIZED MAGNESIUM BY AUGER-ELECTRON SPECTROSCOPY [J].

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SURFACE SCIENCE, 1975, 47 (01) :41-47

[9] AUGER SATELLITE AND OTHER CHARACTERISTIC EVENTS IN MG SECONDARY-ELECTRON SPECTRA [J].

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[10]

LEY L, 1975, PHYS REV B, V11, P690

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