PERMITTIVITY MEASUREMENT OF A THIN SLAB CENTRALLY LOCATED IN A RECTANGULAR WAVEGUIDE

被引：5

作者：

TSANKOV, MA ^{[1
]}

机构：

[1] BULGARIAN ACAD SCI, INST ELECT, LAB MICROWAVE THEORY & TECH, BLVD LENIN 72, SOFIA 13, BULGARIA

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1975年 / 8卷 / 11期

关键词：

D O I：

10.1088/0022-3735/8/11/022

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：963 / 966

页数：4

共 19 条

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NATARAJA.R .

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[8]

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[9] MEASUREMENT OF SEMICONDUCTOR PROPERTIES IN A SLOTTED-WAVEGUIDE STRUCTURE [J].

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[10]

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