KELVIN PROBE FORCE MICROSCOPY

被引：1922
作者：
NONNENMACHER, M
OBOYLE, MP
WICKRAMASINGHE, HK
机构：
来源：
APPLIED PHYSICS LETTERS | 1991年 / 58卷 / 25期
关键词：
D O I：
10.1063/1.105227
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Measurements of the contact potential difference between different materials have been performed for the first time using scanning force microscopy. The instrument has a high resolution for both the contact potential difference (better than 0.1 mV) and the lateral dimension ( < 50 nm) and allows the simultaneous imaging of topography and contact potential difference. Images of gold, platinum, and palladium surfaces, taken in air, show a large contrast in the contact potential difference and demonstrate the basic concept.
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页码：2921 / 2923
页数：3
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