共 50 条
[42]
IN-SITU SCANNING-TUNNELING-MICROSCOPY OF THE SEMICONDUCTOR-ELECTROLYTE INTERFACE
[J].
JOURNAL DE PHYSIQUE IV,
1994, 4 (C1)
:323-327
[45]
ELECTROREFLECTANCE AT THE BISMUTH ELECTROLYTE INTERFACE
[J].
SOVIET ELECTROCHEMISTRY,
1987, 23 (05)
:622-624
[48]
CAPACITANCE MEASUREMENT OF SEMICONDUCTOR-ELECTROLYTE JUNCTION
[J].
DOKLADI NA BOLGARSKATA AKADEMIYA NA NAUKITE,
1986, 39 (02)
:47-50