ELLIPSOMETRY ON MAGNETO-OPTIC THIN-FILM MULTILAYER SYSTEMS

被引：2

作者：

KRANZ, J

SCHRODTER, C

机构：

来源：

APPLIED PHYSICS B-PHOTOPHYSICS AND LASER CHEMISTRY | 1984年 / 34卷 / 03期

关键词：

D O I：

10.1007/BF00697506

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：139 / 143

页数：5

共 9 条

[1] [Anonymous], 1970, MULTIPLE BEAM INTERF
[2] AZZAM RMA, 1979, ELLIPSOMETRY POLARIZ, P386
[3] LOGITUDINAL KERR MAGNETO-OPTIC EFFECT IN MULTILAYER STRUCTURES OF DIELECTRIC AND MAGNETIC FILMS
KEAY, D
LISSBERGER, PH
[J]. OPTICA ACTA, 1968, 15 (04): : 373 - +
[4] MEASUREMENTS OF LONGITUDINAL MAGNETOOPTIC KERR REFLECTION OF A SIMPLE MULTILAYER STRUCTURE
KRANZ, J
STREMME, H
[J]. IEEE TRANSACTIONS ON MAGNETICS, 1969, MAG5 (03) : 453 - +
[5] MEASURING THE MAGNETO-OPTIC KERR EFFECT BY DIFFRACTION
KRANZ, J
SCHRODTER, C
[J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1983, 31 (02): : 59 - 63
[6] Kranz J., 1963, Z ANGEW PHYS, V15, P220
[7] MAGNETO-OPTICAL SCATTERING FROM MULTI-LAYER MAGNETIC AND DIELECTRIC FILMS .I. GENERAL THEORY
SMITH, DO
[J]. OPTICA ACTA, 1965, 12 (01): : 13 - &
[8] MAGNETO-OPTICAL STUDIES ON THIN IRON FILMS
THIELEMANN, P
BRANDT, U
[J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1982, 28 (01): : 53 - 58
[9] [No title captured]