CAPACITANCE/VOLTAGE CHARACTERISTICS OF SEMICONDUCTOR-INSULATOR-SEMICONDUCTOR (SIS) STRUCTURE

被引：1

|

作者：

NAGAI, K

HAYASHI, Y

SEKIGAWA, T

机构：

来源：

ELECTRONICS LETTERS | 1983年 / 19卷 / 10期

关键词：

D O I：

10.1049/el:19830260

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

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页码：376 / 377

页数：2

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