SCANNING FORCE MICROSCOPY STUDIES OF ENHANCED METAL NUCLEATION - AU VAPOR-DEPOSITED ON SELF-ASSEMBLED MONOLAYERS OF SUBSTITUTED SILANES

被引：56

作者：

DUNAWAY, DJ ^{[1
]}

MCCARLEY, RL ^{[1
]}

机构：

[1] LOUISIANA STATE UNIV,DEPT CHEM,BATON ROUGE,LA 70803

来源：

LANGMUIR | 1994年 / 10卷 / 10期

关键词：

D O I：

10.1021/la00022a037

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Scanning force microscopy was used to observe the topography of vapor-deposited Au films on various silane monolayers. Thin (1-10 nm) evaporated Au films deposited onto monolayers of(CH3O)(3)Si(CH2)(3)X (X = -SH, -NH2, and -CH3) on SiO2/Si(111) display morphologies which are dependent on the nature of the Au-X interaction. Macroscopic adhesion tests indicate that the Au is strongly bound to the amine and thiol surfaces. The electrical resistivity of 8 nm thick Au films deposited on the amine-terminated surface was found to be 7 orders of magnitude lower than that for the thiol-terminated surface, indicating that the amine-terminated surface favors an increased number of nucleation sites.

引用

页码：3598 / 3606

页数：9

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[1] SPONTANEOUSLY ORGANIZED MOLECULAR ASSEMBLIES .1. FORMATION, DYNAMICS, AND PHYSICAL-PROPERTIES OF NORMAL-ALKANOIC ACIDS ADSORBED FROM SOLUTION ON AN OXIDIZED ALUMINUM SURFACE [J].