PATTERNING-ASSISTED CONTROL FOR ORDERED ARRANGEMENT OF ATOMIC STEPS ON SI(111) SURFACES

被引:31
|
作者
OGINO, T [1 ]
HIBINO, H [1 ]
HOMMA, Y [1 ]
机构
[1] NIPPON TELEGRAPH & TEL PUBL CORP, INTERDISCIPLINARY RES LABS, MUSASHINO, TOKYO 180, JAPAN
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 1995年 / 34卷 / 6A期
关键词
SILICON; SILICON PROCESS; PATTERNED SURFACE; STEP; ATOM-SCALE CONTROL; WAFER-SCALE CONTROL; SCANNING ELECTRON MICROSCOPY; SELF-ORGANIZATION;
D O I
10.1143/JJAP.34.L668
中图分类号
O59 [应用物理学];
学科分类号
摘要
We propose a novel technique for organizing steps on Si surfaces. Arrays of small holes are formed on Si(111) wafers misoriented toward [11 ($) over bar 2] by using conventional Si technology. The wafers are then annealed in an ultrahigh vacuum at about 1300 degrees C. During the hole filling-in process, steps on the surface are arranged regularly, and finally parallel step bands are ordered after the holes have completely disappeared.
引用
收藏
页码:L668 / L670
页数:3
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