DIRECT ACTIVITY MEASUREMENT AND XK-PHOTON AND GAMMA-PHOTON YIELDS IN THE DECAY OF SM-145

被引：0
作者：
PLCH, J
DRYAK, P
SURAN, J
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来源：
APPLIED RADIATION AND ISOTOPES | 1991年 / 42卷 / 02期
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O61 [无机化学];
学科分类号：
070301 ; 081704 ;
摘要：
Using a direct measurement method the Sm-145 activity was determined with a total error of +/- 0.3% (p = 68.3). The X(K)-photon yield was found to be (133 +/- 1)%; the yield was measured using a windowless 4-pi NaI(Tl) detector. A yield of 61.25 keV gamma-photons equal to (12.15 +/- 0.1)% was determined by a Ge(Li) detector. A value of P(K)omega-K equal to 0.762 +/- 0.01 was found by measuring the sum of X(K-) and gamma-photons in a Ge(Li) detector
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页码：143 / 148
页数：6
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