SURFACE STUDIES BY SPECTRAL ANALYSIS OF INTERNALLY REFLECTED INFRARED RADIATION - HYDROGEN ON SILICON

被引：85
作者：
BECKER, GE
GOBELI, GW
机构：
来源：
JOURNAL OF CHEMICAL PHYSICS | 1963年 / 38卷 / 12期
关键词：
D O I：
10.1063/1.1733624
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
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页码：2942 / &
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