PHASE TOMOGRAPHY IN THE CORRECTED ELECTRON-MICROSCOPE

被引：5
|
作者：
SCHERZER, O
机构：
来源：
ULTRAMICROSCOPY | 1982年 / 9卷 / 1-2期
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D O I：
10.1016/0304-3991(82)90223-6
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
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页码：9 / 15
页数：7
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