ON THE PRECISION AND ACCURACY OF THIN TARGET PIXE ANALYSIS

被引：7

|

作者：

BUDNAR, M

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1989年 / 42卷 / 01期

关键词：

D O I：

10.1016/0168-583X(89)90016-5

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

收藏

页码：122 / 126

页数：5

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