LOW-FREQUENCY RAMAN-SCATTERING OF AS2SXSE3-X

被引：12

作者：

FREITAS, JA

SHANABROOK, BV

STROM, U

机构：

[1] US Naval Research Lab, Washington,, DC, USA, US Naval Research Lab, Washington, DC, USA

来源：

JOURNAL OF NON-CRYSTALLINE SOLIDS | 1985年 / 77-8卷

关键词：

GLASS; METALLIC - Spectroscopic Analysis - SEMICONDUCTING GLASS - Amorphous;

D O I：

10.1016/0022-3093(85)90856-7

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Low-frequency ( less than 60 cm** minus **1) Raman spectra have been measured for a series of chalcogenide glasses and crystals of the form As//2S//xSe//3// minus //x. Comparison of the spectra for x equals 0 and x equals 0. 5 of the crystals clearly establishes the rigid layer (RL) mode character of the peaks near 21 and 31 cm** minus **1 and the admixture of RL and intralayer modes for the series of peaks near 50 cm** minus **1. The observed lineshape of the glasses is interpreted in terms of a density of states of optic modes.

引用

页码：1125 / 1128

页数：4