LOW-FREQUENCY RAMAN-SCATTERING OF AS2SXSE3-X

被引:12
作者
FREITAS, JA
SHANABROOK, BV
STROM, U
机构
[1] US Naval Research Lab, Washington,, DC, USA, US Naval Research Lab, Washington, DC, USA
关键词
GLASS; METALLIC - Spectroscopic Analysis - SEMICONDUCTING GLASS - Amorphous;
D O I
10.1016/0022-3093(85)90856-7
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Low-frequency ( less than 60 cm** minus **1) Raman spectra have been measured for a series of chalcogenide glasses and crystals of the form As//2S//xSe//3// minus //x. Comparison of the spectra for x equals 0 and x equals 0. 5 of the crystals clearly establishes the rigid layer (RL) mode character of the peaks near 21 and 31 cm** minus **1 and the admixture of RL and intralayer modes for the series of peaks near 50 cm** minus **1. The observed lineshape of the glasses is interpreted in terms of a density of states of optic modes.
引用
收藏
页码:1125 / 1128
页数:4
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