RECENT DEVELOPMENTS IN ELECTRICAL MICROCHARACTERIZATION USING THE CHARGE COLLECTION MODE OF THE SCANNING ELECTRON-MICROSCOPE

被引：0

作者：

HOLT, DB ^{[1
]}

LESNIAK, M ^{[1
]}

机构：

[1] UNIV LONDON IMPERIAL COLL SCI & TECHNOL,DEPT MET & MAT SCI,LONDON SW7 2BP,ENGLAND

来源：

SCANNING ELECTRON MICROSCOPY | 1985年

关键词：

D O I：

暂无

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：67 / 86

页数：20

共 50 条

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