WAFER LEVEL HIGH-FREQUENCY MEASUREMENTS OF PHOTODETECTOR CHARACTERISTICS

被引：6

|

作者：

MODOLO, JA

ANDERSON, GW

KUB, FJ

MACK, IAG

机构：

来源：

APPLIED OPTICS | 1988年 / 27卷 / 15期

关键词：

D O I：

10.1364/AO.27.003059

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

收藏

页码：3059 / 3061

页数：3

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