WINDOW THICKNESS MEASUREMENTS ON SURFACE-BARRIER DETECTORS WITH DIFFERENT SURFACE TREATMENTS

被引：3

作者：

HASKO, DG ^{[1
]}

HAQUE, AKMM ^{[1
]}

机构：

[1] POLYTECH S BANK, SCH PHYS, LONDON SE1 0AA, ENGLAND

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1984年 / 222卷 / 03期

关键词：

D O I：

10.1016/0167-5087(84)90382-X

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Window thickness measurements using 340 kev protons from a Van de Graaff accelerator are reported for specially prepared detectors. Controlled surface conditions are employed during detector manufacture resulting in known surface conditions. The window effect is shown to be independent of resistivity, it being characterized by the electric field in the depletion region and the properties of the detector surface. Comparison is made with previous window studies.

引用

页码：530 / 533

页数：4

共 19 条

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