CHARACTERIZATION OF EPITAXIAL SPUTTERED NIXCO1-XO THIN-FILMS ON ALPHA-AL2O3 USING TRANSMISSION ELECTRON-MICROSCOPY

被引：13

作者：

CAO, W

THOMAS, G

CAREY, MJ

BERKOWITZ, AE

机构：

[1] UNIV CALIF SAN DIEGO,DEPT PHYS,LA JOLLA,CA 92093

[2] UNIV CALIF BERKELEY,LAWRENCE BERKELEY LAB,NATL CTR ELECTRON MICROSCOPY,BERKELEY,CA 94720

[3] UNIV CALIF SAN DIEGO,CTR MAGNET RECORDING RES 0401,LA JOLLA,CA 92093

来源：

SCRIPTA METALLURGICA ET MATERIALIA | 1991年 / 25卷 / 12期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1016/0956-716X(91)90130-S

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

[No abstract available]

引用

页码：2633 / 2638

页数：6

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