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- [2] DETERMINATION OF THE THICKNESS OF THIN-FILMS BY THE KIESSIG FRINGE TECHNIQUEANALUSIS, 1982, 10 (05) : 234 - 238MARTINBOUYER, GDETHY, B
- [3] A SIMPLE TECHNIQUE FOR THE DETERMINATION OF MECHANICAL STRAIN IN THIN-FILMS WITH APPLICATIONS TO POLYSILICONJOURNAL OF APPLIED PHYSICS, 1985, 57 (05) : 1671 - 1675GUCKEL, HRANDAZZO, TBURNS, DW
- [4] DETERMINATION OF COBALT AND CHROMIUM IN THIN-FILMSINDUSTRIAL LABORATORY, 1990, 56 (01): : 8 - 9VILENCHIK, ZMZAKHAROV, EKKUZNETSOV, VVKOSHEVAYA, TM
- [5] DETERMINATION OF YOUNG MODULUS OF THIN-FILMSJOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1992, 75 (10) : 2915 - 2917MADDALENA, A
- [6] INTRINSIC STRESS IN SPUTTERED THIN-FILMSJOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1991, 9 (04): : 2431 - 2436WINDISCHMANN, H
- [7] MEASUREMENT OF INTERNAL STRESS IN THIN-FILMSREVIEW OF SCIENTIFIC INSTRUMENTS, 1974, 45 (01): : 114 - 115PAESLER, MAFRITZSCHE, H
- [8] RESIDUAL-STRESS OF THIN-FILMSJOURNAL OF JAPANESE SOCIETY OF TRIBOLOGISTS, 1995, 40 (03) : 228 - 233MIURA, H
- [9] THE YIELD STRESS OF POLYCRYSTALLINE THIN-FILMSJOURNAL OF MATERIALS RESEARCH, 1993, 8 (02) : 237 - 238THOMPSON, CV
- [10] INTRINSIC STRESS OF EPITAXIAL THIN-FILMSPHYSICA SCRIPTA, 1993, T49B : 539 - 543KOCH, RWINAU, DRIEDER, KH