X-RAY CHARACTERIZATION OF SINGLE-CRYSTAL FE FILMS ON GAAS GROWN BY MOLECULAR-BEAM EPITAXY

被引：25
作者：
QADRI, SB [1 ]
GOLDENBERG, M [1 ]
PRINZ, GA [1 ]
FERRARI, JM [1 ]
机构：
[1] USN,RES LAB,CODE 6635,WASHINGTON,DC 20375
来源：
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1985年 / 3卷 / 02期
关键词：
D O I：
10.1116/1.583123
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：718 / 721
页数：4
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