X-RAY CHARACTERIZATION OF SINGLE-CRYSTAL FE FILMS ON GAAS GROWN BY MOLECULAR-BEAM EPITAXY

被引：25

作者：

QADRI, SB ^{[1
]}

GOLDENBERG, M ^{[1
]}

PRINZ, GA ^{[1
]}

FERRARI, JM ^{[1
]}

机构：

[1] USN,RES LAB,CODE 6635,WASHINGTON,DC 20375

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1985年 / 3卷 / 02期

关键词：

D O I：

10.1116/1.583123

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：718 / 721

页数：4

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