MATRIX CALIBRATION FOR THE QUANTITATIVE-ANALYSIS OF LAYERED SEMICONDUCTORS BY SECONDARY ION MASS-SPECTROMETRY

被引：23

作者：

GALUSKA, AA ^{[1
]}

MORRISON, GH ^{[1
]}

机构：

[1] CORNELL UNIV,DEPT CHEM,ITHACA,NY 14853

来源：

ANALYTICAL CHEMISTRY | 1983年 / 55卷 / 13期

关键词：

D O I：

10.1021/ac00263a010

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：2051 / 2055

页数：5

共 19 条

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